Low-Noise, High-Precision, JFET-Input, Op Amp (Rev. H)

Transcrição

Low-Noise, High-Precision, JFET-Input, Op Amp (Rev. H)
OP
A8
OPA827
27
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
Low-Noise, High-Precision, JFET-Input
OPERATIONAL AMPLIFIER
Check for Samples: OPA827
FEATURES
DESCRIPTION
•
The OPA827 series of JFET operational amplifiers
combine outstanding dc precision with excellent ac
performance. These amplifiers offer low offset voltage
(150μV, max), very low drift over temperature
(0.5μV/°C, typ), low bias current (3pA, typ), and very
low 0.1Hz to 10Hz noise (250nVPP, typ). The device
operates over a wide supply voltage range, ±4V to
±18V on a low supply current (4.8mA/Ch, typ).
1
2
•
•
•
•
•
•
•
•
•
INPUT VOLTAGE NOISE DENSITY:
4nV/√Hz at 1kHz
INPUT VOLTAGE NOISE:
0.1Hz to 10Hz: 250nVPP
INPUT BIAS CURRENT: 10pA (max)
INPUT OFFSET VOLTAGE: 150μV (max)
INPUT OFFSET DRIFT: 2.0μV/°C (max)
GAIN BANDWIDTH: 22MHz
SLEW RATE: 28V/μs
QUIESCENT CURRENT: 4.8mA/Ch
WIDE SUPPLY RANGE: ±4V to ±18V
PACKAGES: SO-8 and MSOP-8
Excellent ac characteristics, such as a 22MHz gain
bandwidth product (GBW), a slew rate of 28V/μs, and
precision dc characteristics make the OPA827 series
well-suited for a wide range of applications including
16-bit to 18-bit mixed signal systems, transimpedance
(I/V-conversion) amplifiers, filters, precision ±10V
front ends, and professional audio applications.
The OPA827 is available in both SO-8 and MSOP-8
surface-mount packages, and is specified from –40°C
to +125°C.
APPLICATIONS
•
•
•
•
•
•
•
•
•
ADC DRIVERS
DAC OUTPUT BUFFERS
TEST EQUIPMENT
MEDICAL EQUIPMENT
PLL FILTERS
SEISMIC APPLICATIONS
TRANSIMPEDANCE AMPLIFIERS
INTEGRATORS
ACTIVE FILTERS
INPUT VOLTAGE NOISE DENSITY
vs FREQUENCY
0.1Hz to 10Hz NOISE
VS = ±18V
50nV/div
Voltage Noise Density (nV/ÖHz)
100
10
1
0.1
1
10
100
1k
10k
Time (1s/div)
Frequency (Hz)
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION (1)
PRODUCT
PACKAGE-LEAD
PACKAGE DESIGNATOR
PACKAGE MARKING
Standard Grade
(1)
OPA827AI
SO-8
D
OPA827A
OPA827AI
MSOP-8
DGK
NSP
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS (1)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER
Supply Voltage
VS = (V+) – (V–)
VALUE
UNIT
40
V
Input Voltage (2)
(V–) – 0.5 to (V+) + 0.5
V
Input Current (2)
±10
mA
Differential Input Voltage
±VS
Output Short-Circuit (3)
V
Continuous
Operating Temperature
TA
–55 to +150
°C
Storage Temperature
TA
–65 to +150
°C
Junction Temperature
TJ
+150
°C
Human Body Model (HBM)
4000
V
Charged Device Model (CDM)
1000
V
ESD Ratings
(1)
(2)
(3)
2
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current-limited to 10mA or less.
Short-circuit to VS/2 (ground in symmetrical dual-supply setups).
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
ELECTRICAL CHARACTERISTICS: VS = ±4V to ±18V
Boldface limits apply over the specified temperature range, TA = –40°C to +125°C.
At TA = +25°C, RL = 10kΩ connected to midsupply, VCM = VOUT = midsupply, unless otherwise noted.
OPA827AI
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
OFFSET VOLTAGE
Input Offset Voltage
Drift
vs Power Supply
75
150
μV
dVOS/dT
0.1
2.0
μV/°C
PSRR
0.2
1
μV/V
3
μV/V
±10
pA
VOS
VS = ±15V, VCM = 0V
Over Temperature
INPUT BIAS CURRENT
Input Bias Current
IB
Over Temperature
Input Offset Current
±3
–40°C to +85°C
±500
pA
–40°C to +125°C
±5
nA
±10
pA
IOS
±3
NOISE
Input Voltage Noise:
f = 0.1Hz to 10Hz
en
VS = ±18V, VCM = 0V
250
nVPP
f = 1kHz
en
f = 10kHz
en
VS = ±18V, VCM = 0V
4
nV/√Hz
VS = ±18V, VCM = 0V
3.8
nV/√Hz
in
VS = ±18V, VCM = 0V
2.2
fA/√Hz
Input Voltage Noise Density:
Input Current Noise Density:
f = 1kHz
INPUT VOLTAGE RANGE
Common-Mode Voltage Range
VCM
Common-Mode Rejection Ratio
CMRR
Over Temperature
(V–)+3
(V+)–3
(V−)+3V ≤ VCM ≤ (V+)−3V, VS < 10V
104
114
126
V
dB
(V−)+3V ≤ VCM ≤ (V+)−3V, VS ≥ 10V
114
(V−)+3V ≤ VCM ≤ (V+)−3V, VS < 10V
100
dB
(V−)+3V ≤ VCM ≤ (V+)−3V, VS ≥ 10V
110
dB
dB
INPUT IMPEDANCE
1013 ∥ 9
Differential
13
Common-Mode
10
∥9
Ω ∥ pF
Ω ∥ pF
OPEN-LOOP GAIN
Open-Loop Voltage Gain
AOL
Over Temperature
(V–)+3V ≤ VO ≤ (V+)–3V, RL = 1kΩ
120
(V–)+3V ≤ VO ≤ (V+)–3V, RL = 1kΩ
114
126
dB
dB
FREQUENCY RESPONSE
Gain-Bandwidth Product
Slew Rate
Settling Time, ±0.01%
GBW
G = +1
SR
G = –1
tS
0.00075% (16-bit)
Overload Recovery Time
Total Harmonic Distortion + Noise
THD+N
Copyright © 2006–2012, Texas Instruments Incorporated
22
MHz
28
V/μs
10V Step, G = –1, CL = 100pF
550
ns
10V Step, G = –1, CL = 100pF
850
ns
Gain = –10
150
ns
G = +1, f = 1kHz
0.00004
%
VO = 3VRMS, RL = 600Ω
–128
dB
20
3
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: VS = ±4V to ±18V (continued)
Boldface limits apply over the specified temperature range, TA = –40°C to +125°C.
At TA = +25°C, RL = 10kΩ connected to midsupply, VCM = VOUT = midsupply, unless otherwise noted.
OPA827AI
PARAMETER
CONDITIONS
MIN
RL = 1kΩ, AOL > 120dB
RL = 1kΩ, AOL > 114dB
TYP
MAX
UNIT
(V–)+3
(V+)–3
V
(V–)+3
(V+)–3
OUTPUT
Voltage Output Swing
Over Temperature
Output Current
Short-Circuit Current
Capacitive Load Drive
Open-Loop Output Impedance
IOUT
|VS – VOUT| < 3V
ISC
±55
V
30
mA
±65
mA
CLOAD
See Typical Characteristics
ZO
See Typical Characteristics
POWER SUPPLY
Specified Voltage
VS
Quiescent Current
(per amplifier)
IQ
±4
IOUT = 0A
4.8
Over Temperature
±18
V
5.2
mA
6
mA
TEMPERATURE RANGE
Specified Range
TA
–40
+125
°C
Operating Range
TA
–55
+150
°C
Thermal Resistance
θJA
SO-8, MSOP-8
150
°C/W
PIN CONFIGURATION
D, DGK PACKAGES
SO-8, MSOP-8
(TOP VIEW)
NC
(1)
4
(1)
(1)
1
8
NC
-In
2
7
V+
+In
3
6
Out
V-
4
5
NC
(1)
NC denotes no internal connection.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
TYPICAL CHARACTERISTICS: VS = ±18V
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
INPUT VOLTAGE NOISE DENSITY
vs FREQUENCY
INTEGRATED INPUT VOLTAGE NOISE
vs BANDWIDTH
100
Input Voltage Noise (mV)
Voltage Noise Density (nV/ÖHz)
100
10
10
VPP
1
VRMS
0.1
Noise Bandwidth: 0.1Hz
to indicated frequency.
0.01
1
0.1
1
10
100
1k
10k
1
10
1k
10k
100k
1M
10M
Figure 1.
Figure 2.
TOTAL HARMONIC DISTORTION + NOISE RATIO
vs FREQUENCY
TOTAL HARMONIC DISTORTION + NOISE RATIO
vs AMPLITUDE
0.01
0.01
VS = ± 15V
RL = 600Ω
VOUT = 3VRMS
0.001
G = 10
0.0001
G=1
0.001
THD+N (%)
THD+N (%)
100
Bandwidth (Hz)
Frequency (Hz)
G=1
0.0001
VS = ± 15V
RL = 600 Ω
f = 1 kHz
0.00001
20
100
1k
Frequency (Hz)
10k
0.00001
10m
20k
G000
Figure 3.
G = 10
100m
1
Voltage (Vrms)
10
20
G001
Figure 4.
50nV/div
0.1Hz to 10Hz NOISE
Time (1s/div)
Figure 5.
Copyright © 2006–2012, Texas Instruments Incorporated
5
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
OFFSET VOLTAGE
PRODUCTION DISTRIBUTION
OFFSET VOLTAGE DRIFT
PRODUCTION DISTRIBUTION
25
15
10
5
0
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
2
135
20
150
105
120
75
90
60
30
45
0
15
-15
-30
-45
-60
-90
-75
-105
-120
-135
-150
Population
Pecentage of Amplifiers (%)
VS = ±15V
Offset Voltage (mV)
250
OFFSET VOLTAGE
vs COMMON-MODE VOLTAGE
OFFSET VOLTAGE
vs COMMON-MODE VOLTAGE
250
10 Typical Units Shown
150
150
100
100
50
50
0
-50
0
-50
-100
-100
-150
-150
-200
-200
-250
3.0
15
10
5
0
-5
-10
-15
-20
-25
-30
-35
-40
-45
-50
-55
-60
-65
3.2
3.4
3.6
3.8
4.0
4.2
4.4
4.6
4.8
3
5.0
8
13
18
23
28
VCM (V)
VCM (V)
Figure 8.
Figure 9.
VOS WARMUP
OFFSET VOLTAGE DRIFT
vs TEMPERATURE
250
33
VS = ±15V
200
150
100
VOS (mV)
VOS Shift (mV)
10 Typical Units Shown
VS = 36V
200
VOS (mV)
VOS (mV)
Figure 7.
-250
50
Specified Temperature Range
0
-50
-100
-150
VS = ±15V
0
50
20 Typical Units Shown
100
150
Time (s)
Figure 10.
6
G001
Figure 6.
VS = 8V
200
Offset Voltage Drift (µV/°C)
200
250
300
-200
-250
-75
-50
-25
0
25
50
75
100
125
150
Temperature (°C)
Figure 11.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
INPUT BIAS CURRENT AND OFFSET CURRENT
vs SUPPLY VOLTAGE
10
20
− IB
+ IB
8
15
Specified Common-Mode
6
10
4
Voltage Range
5
2
IB (pA)
Input Bias Current (pA)
INPUT BIAS CURRENT
vs COMMON-MODE VOLTAGE
0
−2
Unit 3
-5
−4
-10
−6
Unit 2
-15
−8
−10
4
6
8
10
12
14
Supply Voltage (V)
16
-20
18
-18 -15 -12 -9
-6
-3
G002
0
3
6
9
12
Figure 13.
INPUT BIAS CURRENT vs TEMPERATURE
NORMALIZED QUIESCENT CURRENT
vs TIME
0.05
− IB
+ IB
IOS
10000
15
18
VCM (V)
Figure 12.
12000
10 Typical Units Shown
0
-0.05
-0.10
8000
I Q Shift (mA)
Input Bias Current (pA)
Unit 1
0
6000
4000
-0.15
-0.20
-0.25
-0.30
-0.35
2000
-0.40
0
−50
-0.45
−25
0
25
50
75
Temperature (°C)
100
125
150
0
50
100
G002
150
200
250
300
33
38
Time (s)
Figure 14.
Figure 15.
QUIESCENT CURRENT
vs TEMPERATURE
QUIESCENT CURRENT
vs SUPPLY VOLTAGE
6.0
5.00
4.95
VS = ±18V
5.5
4.85
5.0
IQ (mA)
IQ (mA)
4.90
VS = ±5V
4.5
4.80
4.75
4.70
4.0
4.65
3.5
-75
4.60
-50
-25
0
25
50
75
Temperature (°C)
Figure 16.
Copyright © 2006–2012, Texas Instruments Incorporated
100
125
150
8
13
18
23
28
VS (V)
Figure 17.
7
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
OUTPUT VOLTAGE SWING
vs OUTPUT CURRENT
5
16
VS = ±5V
4
-40°C
+150°C
+25°C
+125°C
+85°C -40°C
0
-1
-2
Output Swing (V)
8
2
1
4
+150°C +125°C +85°C
0
-40°C
+25°C
-55°C
-4
-8
-55°C
-3
VS = ±18V
12
-55°C
3
Output Swing (V)
OUTPUT VOLTAGE SWING
vs OUTPUT CURRENT
-12
-4
-5
-16
30
20
40
50
60
70
48
73
53
58
63
68
73
Output Current (mA)
Output Current (mA)
Figure 18.
Figure 19.
POWER-SUPPLY REJECTION RATIO
vs FREQUENCY
COMMON-MODE REJECTION RATIO
vs FREQUENCY
180
140
Referred to Input
160
Positive
VS ³ 10V
120
120
100
CMRR (dB)
PSRR (dB)
140
Negative
80
60
100
80
60
40
40
20
0
20
0.1
1
10
100
1k
10k 100k
1M
0.1
10M 100M
1
10
100
1k
10k
100k
1M
10M 100M
Frequency (Hz)
Frequency (Hz)
Figure 20.
Figure 21.
POWER-SUPPLY REJECTION RATIO
vs TEMPERATURE
COMMON-MODE REJECTION RATIO
vs TEMPERATURE
0.30
1.6
1.4
1.2
CMRR (mV/V)
PSRR (mV/V)
0.25
0.20
0.15
1.0
0.8
0.6
0.4
0.2
0.0
0.10
-0.2
0.05
-75
-0.4
-50
-25
0
25
50
Temperature (°C)
Figure 22.
8
75
100
125
150
-75
-50
-25
0
25
50
75
100
125
150
Temperature (°C)
Figure 23.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
OPEN-LOOP GAIN AND PHASE
vs FREQUENCY
CLOSED-LOOP GAIN
vs FREQUENCY
50
0
140
30
Phase
-90
60
40
Phase (°)
80
Gain (dB)
-45
100
Gain (dB)
G = +101
40
120
10
G = +1
0
-10
-135
20
G = +11
20
-20
0
Gain
-20
1
10
100
1k
10k
100k
1M
10M
-30
100
-180
100M
1k
10k
10M
Figure 25.
OPEN-LOOP GAIN
vs TEMPERATURE
OPEN-LOOP OUTPUT IMPEDANCE
vs FREQUENCY
100M
1000
Open-Loop Output Impedance (ZO)
RL = 1kW
1.0
AOL (mV/V)
1M
Figure 24.
1.2
0.8
0.6
0.4
0.2
-75
100k
Frequency (Hz)
Frequency (Hz)
-50
-25
0
25
50
75
100
125
100
10
1
100
150
1k
100k
10k
1M
Temperature (°C)
Frequency (Hz)
Figure 26.
Figure 27.
SMALL-SIGNAL OVERSHOOT
vs CAPACITIVE LOAD
NO PHASE REVERSAL
10M
100M
70
100mV Output Step
G = +1
Output
50
40
G = -1
30
5V/div
Overshoot (%)
60
+18V
OPA827
20
Output
10
-18V
37VPP
Sine Wave
(±18.5V)
0
0
100
200 300 400 500 600 700 800 900 1000
0.5ms/div
Capacitive Load (pF)
Figure 28.
Copyright © 2006–2012, Texas Instruments Incorporated
Figure 29.
9
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
POSITIVE OVERLOAD RECOVERY
NEGATIVE OVERLOAD RECOVERY
G = -10
G = -10
VIN
5V/div
5V/div
VOUT
0V
10kW
0V
10kW
1kW
VIN
1kW
OPA827
VOUT
OPA827
VIN
VOUT
VIN
VOUT
Time (0.5ms/div)
Time (0.5ms/div)
Figure 30.
Figure 31.
SMALL-SIGNAL STEP RESPONSE
SMALL-SIGNAL STEP RESPONSE
+18V
OPA827
-18V
C1
5.6pF
20mV/div
20mV/div
G = +1
RL = 1kW
CL = 100pF
R1
1kW
+18V
OPA827
RL
CL
CL
G = -1
CL = 100pF
Time (0.1ms/div)
-18V
Time (0.1ms/div)
Figure 33.
LARGE-SIGNAL STEP RESPONSE
LARGE-SIGNAL STEP RESPONSE
2V/div
2V/div
Figure 32.
G = +1
RL = 1kW
CL = 100pF
Time (0.5ms/div)
Figure 34.
10
R2
1kW
G = -1
CL = 100pF
Time (0.5ms/div)
Figure 35.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
TYPICAL CHARACTERISTICS: VS = ±18V (continued)
At TA = +25°C, RL = 10kΩ connected to midsupply, and VCM = VOUT = midsupply, unless otherwise noted.
1.0
0.010
0.008
0.8
0.008
0.6
0.006
0.6
0.006
0.4
0.004
16-Bit
Settling
0.2
0.002
0
0
-0.002
-0.2
(±1/2 LSB =
±0.00075%)
-0.4
-0.004
-0.6
-0.006
-0.8
-1.0
100
200 300
400 500 600
Time (ns)
D From Final Value (mV)
0.010
0.8
0.4
0.004
16-Bit
Settling
0.2
0.002
0
0
-0.2
-0.002
(±1/2 LSB =
±0.00075%)
-0.4
-0.004
-0.6
-0.006
-0.008
-0.8
-0.008
-0.010
700 800 900 1000
-1.0
0
100
200 300
400 500 600
Time (ns)
-0.010
700 800 900 1000
Figure 36.
Figure 37.
LARGE-SIGNAL NEGATIVE SETTLING TIME
(10VPP, CL = 100pF)
LARGE-SIGNAL NEGATIVE SETTLING TIME
(10VPP, CL = 10pF)
0.010
0.8
0.008
0.6
0.006
0.6
0.006
0.4
0.004
16-Bit
Settling
0.2
0.002
0
0
-0.002
-0.2
(±1/2 LSB =
±0.00075%)
-0.4
-0.004
-0.6
-0.006
-0.8
-1.0
0
100
200 300
400 500 600
Time (ns)
D From Final Value (mV)
1.0
0.008
0.004
16-Bit
Settling
0.2
0.002
0
0
-0.002
-0.2
(±1/2 LSB =
±0.00075%)
-0.4
-0.004
-0.6
-0.006
-0.008
-0.8
-0.008
-0.010
700 800 900 1000
-1.0
0
100
200 300
400 500 600
Time (ns)
Figure 38.
D From Final Value (%)
0.010
0.8
D From Final Value (%)
1.0
0.4
D From Final Value (%)
1.0
0
D From Final Value (mV)
LARGE-SIGNAL POSITIVE SETTLING TIME
(10VPP, CL = 10pF)
D From Final Value (%)
D From Final Value (mV)
LARGE-SIGNAL POSITIVE SETTLING TIME
(10VPP, CL = 100pF)
-0.010
700 800 900 1000
Figure 39.
SHORT-CIRCUIT CURRENT
vs TEMPERATURE
80
Sourcing
60
ISC (mA)
40
20
0
-20
-40
Sinking
-60
-80
-75
-25
25
75
125
175
Temperature (°C)
Figure 40.
Copyright © 2006–2012, Texas Instruments Incorporated
11
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
APPLICATION INFORMATION
OPERATING VOLTAGE
The OPA827 series of op amps can be used with
single or dual supplies from an operating range of
VS = +8V (±4V) and up to VS = +36V (±18V). This
device does not require symmetrical supplies; it only
requires a minimum supply voltage of 8V. Supply
voltages higher than +40V (±20V) can permanently
damage the device; see the Absolute Maximum
Ratings table. Key parameters are specified over the
operating temperature range, TA = –40°C to +125°C.
Key parameters that vary over the supply voltage or
temperature range are shown in the Typical
Characteristics section of this data sheet.
NOISE PERFORMANCE
Figure 41 shows the total circuit noise for varying
source impedances with the operational amplifier in a
unity-gain configuration (with no feedback resistor
network and therefore no additional noise
contributions). The OPA827 (GBW = 22MHz) and
OPA211 (GBW = 80MHz) are both shown in this
example with total circuit noise calculated. The op
amp itself contributes both a voltage noise
component and a current noise component. The
voltage noise is commonly modeled as a time-varying
component of the offset voltage. The current noise is
modeled as the time-varying component of the input
bias current and reacts with the source resistance to
create a voltage component of noise. Therefore, the
lowest noise op amp for a given application depends
on the source impedance. For low source impedance,
current noise is negligible, and voltage noise
generally dominates. The OPA827 family has both
low voltage noise and lower current noise because of
the FET input of the op amp. Very low current noise
allows for excellent noise performance with source
impedances greater than 10kΩ. The OPA211 has
lower voltage noise and higher current noise. The low
voltage noise makes the OPA211 a better choice for
low source impedances (less than 2kΩ). For high
source impedance, current noise may dominate, and
makes the OPA827 series amplifier the better choice.
12
The equation in Figure 41 shows the calculation of
the total circuit noise, with these parameters:
• en = voltage noise
• in = current noise
• RS = source impedance
• k = Boltzmann's constant = 1.38 × 10–23 J/K
• T = temperature in kelvins
For more details on calculating noise, see the Basic
Noise Calculations section.
10k
Votlage Noise Spectral Density, EO
The OPA827 is a unity-gain stable, precision
operational amplifier with very low noise, input bias
current, and input offset voltage. Applications with
noisy or high impedance power supplies require
decoupling capacitors placed close to the device pins.
In most cases, 0.1μF capacitors are adequate.
EO
1k
OPA211
RS
100
OPA827
Resistor Noise
10
2
2
2
EO = en + (in RS) + 4kTRS
1
100
1k
10k
100k
1M
Source Resistance, RS (W)
Figure 41. Noise Performance of the OPA827 and
OPA211 in Unity-Gain Buffer Configuration
BASIC NOISE CALCULATIONS
Low-noise circuit design requires careful analysis of
all noise sources. External noise sources can
dominate in many cases; consider the effect of
source resistance on overall op amp noise
performance. Total noise of the circuit is the rootsum-square combination of all noise components.
The resistive portion of the source impedance
produces thermal noise proportional to the square
root of the resistance. This function is plotted in
Figure 41. The source impedance is usually fixed;
consequently, select the op amp and the feedback
resistors to minimize the respective contributions to
the total noise.
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
Figure 42 illustrates both noninverting (A) and
inverting (B) op amp circuit configurations with gain.
In circuit configurations with gain, the feedback
network resistors also contribute noise. The current
noise of the op amp reacts with the feedback
resistors to create additional noise components.
The feedback resistor values can generally be
chosen to make these noise sources negligible. Note
that low impedance feedback resistors will load the
output of the amplifier. The equations for total noise
are shown for both configurations.
A) Noise in Noninverting Gain Configuration
Noise at the output:
R2
2
2
2
EO
R1
= 1+
R2
R1
2
en
2
+ e1 +
EO
2
e2
R2
Where eS = Ö4kTRS ´ 1 +
R1
2
+ (inR2) +
2
eS
2
+ (inRS)
1+
R2
R1
= thermal noise of RS
RS
e1 = Ö4kTR1 ´
VS
R2
R1
= thermal noise of R1
e2 = Ö4kTR2 = thermal noise of R2
B) Noise in Inverting Gain Configuration
Noise at the output:
R2
2
2
EO = 1 +
R1
R2
R1 + RS
EO
RS
Where eS = Ö4kTRS ´
2
2
2
2
2
en + e1 + e2 + (inR2) + eS
R2
R1 + RS
= thermal noise of RS
VS
e1 = Ö4kTR1 ´
R2
R1 + RS
= thermal noise of R1
e2 = Ö4kTR2 = thermal noise of R2
For the OPA827 series op amps at 1kHz, en = 4nV/ÖHz and in = 2.2fA/ÖHz.
Figure 42. Noise Calculation in Gain Configurations
Copyright © 2006–2012, Texas Instruments Incorporated
13
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
TOTAL HARMONIC DISTORTION
MEASUREMENTS
of the circuit. The closed-loop gain is unchanged, but
the feedback available for error correction is reduced
by a factor of 101, thus extending the resolution by
101. Note that the input signal and load applied to the
op amp are the same as with conventional feedback
without R3. The value of R3 should be kept small to
minimize its effect on the distortion measurements.
The OPA827 series op amps have excellent distortion
characteristics. THD + Noise is below 0.0001%
(G = +1, VO = 3VRMS) throughout the audio frequency
range, 20Hz to 20kHz, with a 600Ω load (see
Figure 3).
The distortion produced by the OPA827 series is
below the measurement limit of many commercially
available testers. However, a special test circuit
(illustrated in Figure 43) can be used to extend the
measurement capabilities.
Op amp distortion can be considered an internal error
source that can be referred to the input. Figure 43
shows a circuit that causes the op amp distortion to
be 101 times greater than that distortion normally
produced by the op amp. The addition of R3 to the
otherwise
standard
noninverting
amplifier
configuration alters the feedback factor or noise gain
R1
The validity of this technique can be verified by
duplicating measurements at high gain and/or high
frequency where the distortion is within the
measurement capability of the test equipment.
Measurements for this data sheet were made with an
Audio Precision System Two distortion/noise
analyzer, which greatly simplifies such repetitive
measurements. This measurement technique,
however, can be performed with manual distortion
measurement instruments.
R2
SIGNAL DISTORTION
GAIN
GAIN
R3
OPA827
VO = 3VRMS
R
Signal Gain = 1+ 2
R1
Distortion Gain = 1+
R2
R1 II R3
Generator
Output
R1
R2
R3
1
101
¥
1kW
10W
11
101
100W
1kW
11W
Analyzer
Input
Audio Precision
System Two(1)
with PC Controller
RL
600W
NOTE: (1) Measurement BW = 80kHz.
Figure 43. Distortion Test Circuit
14
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
Capacitive load drive depends on the gain and
overshoot requirements of the application. Capacitive
loads limit the bandwidth of the amplifier. Increasing
the gain enhances the ability of the amplifier to drive
greater capacitive loads (see Figure 28).
PHASE-REVERSAL PROTECTION
The OPA827 family has internal phase-reversal
protection. Many FET-input op amps exhibit a phase
reversal when the input is driven beyond its linear
common-mode range. This condition is most often
encountered in noninverting circuits when the input is
driven beyond the specified common-mode voltage
range, causing the output to reverse into the opposite
rail. The input circuitry of the OPA827 prevents phase
reversal with excessive common-mode voltage;
instead, the output limits into the appropriate rail (see
Figure 29).
Copyright © 2006–2012, Texas Instruments Incorporated
50mV/div
VOUT
Figure 44. OPA827 Driving 2.2μF Ceramic
Capacitor
100mV/div
In Figure 45, the OPA827 is driving a 2.2μF tantalum
capacitor. A relatively small ESR that is internal to the
capacitor additionally improves phase margin and
provides an output waveform with no ringing and
minimal overshoot. Figure 45 shows a stable system
that can be used in almost any application.
VIN
20ms/div
50mV/div
The combination of gain bandwidth product (GBW)
and near constant open loop output impedance (ZO)
over frequency gives the OPA827 the ability to drive
large capacitive loads. Figure 44 shows the OPA827
connected in a buffer configuration (G = +1) while
driving a 2.2μF ceramic capacitor (with an ESR value
of approximately 0Ω). The small overshoot and fast
settling time are results of good phase margin. This
feature provides superior performance compared to
the competition. Figure 44 and Figure 45 were taken
without any resistive load in parallel to shorten the
ringing time.
100mV/div
CAPACITIVE LOAD AND STABILITY
VIN
VOUT
20ms/div
Figure 45. OPA827 Driving 2.2μF Tantalum
Capacitor
15
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
TRANSIMPEDANCE AMPLIFIER
Bandwidth (f–3dB) calculated by Equation 2:
The gain bandwidth, low voltage noise, and current
noise of the OPA827 series make them ideal wide
bandwidth transimpedance amplifiers in a photoconductive application. High transimpedance gains
with feedback resistors greater than 100kΩ benefit
from the low input current noise (2.2fA/Hz) of the
JFET input. Low voltage noise is important because
photodiode capacitance causes the effective noise
gain in the circuit to increase at high frequencies.
Total input capacitance of the circuit limits the overall
gain bandwidth of the amplifier and is addressed
below.
Figure
46
shows
a
photodiode
transimpedance application.
f-3dB =
(1)
CF
< 1pF
RF
1MW
CSTRAY
(2)
+VS
OPA827
ID
With these three variables set, the feedback capacitor
value (CF) can be calculated to ensure stability.
CSTRAY is the parasitic capacitance of the PCB and
passive components, which is approximately 0.5pF.
CTOT
VOUT = IDRF
-VS
NOTES: (1) CF is optional to prevent gain peaking.
(2) CSTRAY is the stray capacitance of RF
(typically, 2pF for a surface-mount resistor).
To ensure 45° phase margin, the minimal amount of
feedback capacitance can be calculated using
Equation 1:
1
CF
1+ 1+ (8pCTOTRFUGBW
4pRFUGBW
)(
(2)
These equations result in maximum transimpedance
bandwidth. For additional information, refer to
Application
Bulletin
SBOA055,
Compensate
Transimpedance Amplifiers Intuitively, available for
download at www.ti.com.
Key Transimpedance Points
• The total input capacitance (CTOT) consists of the
photodiode junction capacitance, and both the
common-mode and differential input capacitance
of the operational amplifier.
• The desired transimpedance gain, VOUT = IDRF.
• The Unity Gain Bandwidth Product (UGBW)
(22MHz for the OPA827).
(
UGBW
Hz
2pRF(CTOT)
Figure 46. Transimpedance Amplifier
)
(1)
V+
IN+
IN-
OUT
V-
Figure 47. Equivalent Schematic (Single Channel)
16
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
PHASE-LOCK LOOP
The OPA827 is well-suited for phase-lock loop (PLL)
applications because of the low voltage offset, low
noise, and wide gain bandwidth. Figure 48 illustrates
an example of the OPA827 in this application. The
first amplifier (OPA827) provides the loop low-pass,
active filter function, while the second amplifier
(OPA211) serves as a scaling amplifier. This second
stage amplifies the dc error voltage to the appropriate
level before it is applied to the voltage-controlled
oscillator (VCO).
Operational amplifiers used in PLL applications are
often required to have low voltage offset. As with
other dc levels generated in the loop, a voltage offset
applied to the VCO is interpreted as a phase error.
An operational amplifier with inherently low voltage
offset helps reduce this source of error. Also, any
noise produced by the operational amplifiers
modulates the voltage applied to the VCO and limits
the spectral purity of the oscillator output. The VCO
generates noise-related, random phase variations of
its own, but this characteristic becomes worse when
the input voltage source noise is included. This noise
appears as random sideband energy that can limit
system performance. The very low flicker noise (1/f)
and current noise (In) of the OPA827 help to
minimize the operational amplifier contribution to the
phase noise.
Offset Voltage Generator
(Frequency Adjustment)
Scaling
Amplifier
Low-Pass Filter
Current
Source
Input Signal Phase Dector
Output Signal
OPA827
OPA211
Current
Source
VCO
Level Adjustment and
Buffer Amplifier
Divider
1/N
Figure 48. PLL Application
Copyright © 2006–2012, Texas Instruments Incorporated
17
OPA827
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
www.ti.com
OPA827 USED AS AN I/V CONVERTER
NOTE: CODE is the digital input into the DAC.
The OPA827 series of operation amplifiers have low
current noise and offset voltage that make these
devices a great choice for an I/V converter. The
DAC8811 is a single channel, current output, 16-bit
digital-to-analog converter (DAC). The IOUT terminal
of the DAC is held at a virtual GND potential by the
use of the OPA827 as an external I/V converter op
amp. The R-2R ladder is connected to an external
reference input (VREF) that determines the DAC fullscale current. The external reference voltage can
vary in a range of –15V to +15V, thus providing
bipolar IOUT current operation. By using the OPA827
as an external I/V converter in conjunction with the
internal DAC8811 RFB resistor, output voltage ranges
of –VREF to +VREF can be generated.
The DAC output impedance as seen looking into the
IOUT terminal changes versus code. The low offset
voltage of the OPA827 minimizes the error
propagated from the DAC.
When using an external I/V converter and the
DAC8811 RFB resistor, the DAC output voltage is
given by Equation 3.
-VREF ´ CODE
VOUT =
65536
(3)
For a current-to-voltage design (see Figure 49), the
DAC8811 IOUT pin and the inverting node of the
OPA827 should be as short as possible and adhere
to good PCB layout design. For each code change on
the output of the DAC, there is a step function. If the
parasitic capacitance is excessive at the inverting
node, then gain peaking is possible. For circuit
stability, two compensation capacitors, C1 and C2(4pF
to 20pF typical) can be added to the design.
Some applications require full four-quadrant
multiplying capabilities or a bipolar output swing. As
shown in Figure 49, the OPA827 is added as a
summing amp and has a gain of 2x that widens the
output span to 20V. A four-quadrant multiplying circuit
is implemented by using a 10V offset of the reference
voltage to bias the OPA827.
10kW
10kW
C2
5kW
VDD
RFB
+10V
VREF
OPA827
C1
VOUT
DAC8811
IOUT
OPA827
-10V £ VOUT £ +10V
GND
Figure 49. I/V Converter
18
Copyright © 2006–2012, Texas Instruments Incorporated
OPA827
www.ti.com
SBOS376H – NOVEMBER 2006 – REVISED MAY 2012
REVISION HISTORY
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision G (February 2012) to Revision H
Page
•
Updated Figure 3 .................................................................................................................................................................. 5
•
Updated Figure 4 .................................................................................................................................................................. 5
Changes from Revision F (March 2009) to Revision G
Page
•
Changed product status from Mixed Status to Production Data .......................................................................................... 1
•
Changed Input bias current and Input offset drift Features bullets ....................................................................................... 1
•
Changed description of amplifier drift and bias current in first paragraph of Description section ........................................ 1
•
Deleted high grade (OPA827I) option and footnote 2 from Package/Ordering Information table ........................................ 2
•
Deleted high grade (OPA827I) option from Electrical Characteristics table ......................................................................... 3
•
Changed Offset Voltage, Input Offset Voltage Drift parameter typical and maximum specifications in Electrical
Characteristics table ............................................................................................................................................................. 3
•
Changed Input Bias Current section specifications in Electrical Characteristics table ......................................................... 3
•
Changed -40°C to +85°C Input Bias Current parameter unit ............................................................................................... 3
•
Added Frequency Response, Slew Rate parameter minimum specification to Electrical Characteristics table .................. 3
•
Deleted high grade (OPA827I) option from Electrical Characteristics table ......................................................................... 4
•
Added Output, Short-Circuit Current parameter minimum specification to Electrical Characteristics table ......................... 4
•
Updated Figure 7 .................................................................................................................................................................. 6
•
Updated Figure 8 .................................................................................................................................................................. 6
•
Updated Figure 9 .................................................................................................................................................................. 6
•
Updated Figure 11 ................................................................................................................................................................ 6
•
Updated Figure 12 ................................................................................................................................................................ 7
•
Updated Figure 14 ................................................................................................................................................................ 7
Copyright © 2006–2012, Texas Instruments Incorporated
19
PACKAGE OPTION ADDENDUM
www.ti.com
18-Oct-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
OPA827AID
ACTIVE
SOIC
D
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA
827
A
OPA827AIDG4
ACTIVE
SOIC
D
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA
827
A
OPA827AIDGKR
ACTIVE
VSSOP
DGK
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU |
CU NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
NSP
OPA827AIDGKT
ACTIVE
VSSOP
DGK
8
250
Green (RoHS
& no Sb/Br)
CU NIPDAU |
CU NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
NSP
OPA827AIDR
ACTIVE
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA
827
A
OPA827AIDRG4
ACTIVE
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 125
OPA
827
A
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
18-Oct-2013
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jun-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
OPA827AIDGKR
VSSOP
DGK
8
OPA827AIDGKT
VSSOP
DGK
OPA827AIDR
SOIC
D
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
2500
330.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
8
250
180.0
12.4
5.3
3.4
1.4
8.0
12.0
Q1
8
2500
330.0
12.4
6.4
5.2
2.1
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jun-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
OPA827AIDGKR
VSSOP
DGK
8
2500
367.0
367.0
35.0
OPA827AIDGKT
VSSOP
DGK
8
250
210.0
185.0
35.0
OPA827AIDR
SOIC
D
8
2500
367.0
367.0
35.0
Pack Materials-Page 2
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