Analytical Methods in Materials Science 2016

Analytical Methods in Materials Science 2016

Analytical Methods in Materials Science 2016
(TFFM40)
Lab
1
2
3
4
5
6
7
8
9
10
Period Day Date Time
VT1
Thu 18/2 13-21
VT1
Thu 25/2 13-21
VT1
Thu 3/3 13-21
VT1
Thu 10/3 13-21
VT2
Thu 7/4 13-21
VT2
Thu 14/4 13-21
VT2
Thu 21/4 13-21
VT2
Thu 28/4 13-21
VT2 Mon 2/5 13-21
VT2
Thu 12/5 13-21
Group 1
LOM (6h)
SEM+EDX (8h)
TEM (6h)
ED (6h)
XRD (8h)
XPS+AES (6h)
SIMS (6h)
Ellips (4h)
extra
extra
Group 2
XRD (8h)
LOM (6h)
SEM+EDX (8h)
XPS+AES (6h)
TEM (6h)
ED (6h)
Ellips (4h)
SIMS (6h)
extra
extra
Group 3
Group 4
Ellips (4h)
TEM (6h)
XRD (8h)
ED (6h)
LOM (6h)
Ellips (4h)
SEM+EDX (8h)
LOM (6h)
XPS+AES (6h)
SIMS (6h)
SIMS (6h)
SEM+EDX (8h)
TEM (6h)
XPS+AES (6h)
ED (6h)
XRD (8h)
extra
extra
extra
extra
Boundary conditions: Preferably LOM before TEM and SEM, TEM before ED, AES+XPS after SEM, no TEM at the
same time as ED, SIMS starting after w.10, availability of lab assistants due to conference travel, etc.
Laboration
1 LOM
2 XRD
Lab assistant
Laurent Souqui
Chung-Chuan Lai
E-mail
[email protected]
[email protected]
3
Mewlude Imam
[email protected]
Bilal Syed
Ingemar Persson
Roger Magnusson
[email protected]
[email protected]
[email protected]
Nina Turesson
[email protected]
Jens Jensen
[email protected]
4
5
6
7
8
Light Optical Microscopy
X-ray Diffraction
Scanning Electron Microscopy + Energy
SEM+EDX
Dispersive X-ray Photospectroscopy
TEM
Transmission Electron Microscopy
ED
Electron Diffraction
Ellips
Ellipsometry
Auger Electron Spectroscopy + X-ray
AES+XPS
photoelectron spectroscopy
SIMS
Secondary Ion Mass Spectrometry